Share Email Print
cover

Proceedings Paper

Proton damage effects in EEV charge-coupled devices
Author(s): Andrew D. Holland; Anthony F. Abbey; David H. Lumb; Kieran J. McCarthy
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

An examination is conducted of the effects of low-energy protons on CCD performance to evaluate the potential effectiveness of space-borne observational instruments. Degradation is described as a function of incremental dose, irradiation temperature, or proton energy for several device architectures, some of which incorporate design features to minimize signal-charge/trapping-site interaction. Degradation of the charge transfer is studied for very low proton doses, and dark current is found to vary directly with proton dose. Displacement damage in the signal-transfer channels generates charge-trapping sites that have a negative effect on EEV CCD performance. Degradation of charge-transfer performance is shown to be the most significant hindrance to effective CCD operations for X-ray spectroscopic applications.

Paper Details

Date Published: 1 November 1990
PDF: 18 pages
Proc. SPIE 1344, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy, (1 November 1990); doi: 10.1117/12.23266
Show Author Affiliations
Andrew D. Holland, Univ. of Leicester (United Kingdom)
Anthony F. Abbey, Univ. of Leicester (United Kingdom)
David H. Lumb, Univ. of Leicester (United Kingdom)
Kieran J. McCarthy, Univ. of Leicester (United Kingdom)


Published in SPIE Proceedings Vol. 1344:
EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy
Oswald H. W. Siegmund; Hugh S. Hudson, Editor(s)

© SPIE. Terms of Use
Back to Top