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Proceedings Paper

Scanning distortion analysis of infrared thermal imaging systems
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Paper Abstract

The optical system of infrared scanning thermal imager using linear array detector has inherent geometric distortion along the linear array direction of the detector. The reason of scanning distortion is analysed, and the mathematical formula of scanning distortion in the linear array direction is derived by using vector method. The mathematical results show that the distortion D along the linear array direction in the optical system of infrared scanning thermal imager is related to the sway angle θ of the scanning mirror. In order to verify the calculation results, Code V software is used to analyse the optical system of infrared scanning thermal imager, and the distortion of different sway angles is obtained and compared with the theoretical calculation values.

Paper Details

Date Published: 5 November 2018
PDF: 9 pages
Proc. SPIE 10815, Optical Design and Testing VIII, 108150X (5 November 2018); doi: 10.1117/12.2326281
Show Author Affiliations
Xi Wang, North China Research Institute of Electro-optics (China)
Qingqing Peng, North China Research Institute of Electro-optics (China)
Lin Liu, North China Research Institute of Electro-optics (China)
Jiaqiang Yang, North China Research Institute of Electro-optics (China)
Xiaoyu Du, North China Research Institute of Electro-optics (China)
Yangyang Li, North China Research Institute of Electro-optics (China)


Published in SPIE Proceedings Vol. 10815:
Optical Design and Testing VIII
Yongtian Wang; Tina E. Kidger; Kimio Tatsuno, Editor(s)

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