Share Email Print
cover

Proceedings Paper • new

Spectral imaging processing and gas identification based on FTIR imaging spectrometer
Author(s): Chen-sheng Wang; Guowei Jia; Debin Pan; Zhijie Zhang; Hai Tan
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Infrared spectral imaging has been used in many fields, such as gas identification, environmental monitoring and target detection. In practical application, it is difficult to classify the spectrum between target and background due to cluster background and instrument noise. This article introduces the design of a modular FTIR imaging spectrometer based on interference optics and accurate control module. Based on this instrument, a spectral feature analysis and gas identification method is proposed and verified via experiment. The exact steps and algorithms include radiometric calibration, spectral pre-process, and spectral matching. First, multiple-points linear radiometric calibration is indicated to improve the calibration accuracy. Secondly, the spectral pre-processing methods are realized to decrease the noise and enhance the spectral difference between target and background. Thirdly, spectral matching based on similarity calculation is introduced to realize gas identification. Three methods, Euclidean distance (ED), spectral angle mapping (SAM) and spectral information divergence (SID), are derived. Finally, an experimental test is designed to verify the method proposed in this article, where SF6 is taken as the target. According to the results, various algorithms have different performance in time consumption and accuracy, and the proposed method is verified to be reliable and accurate in practical field test.

Paper Details

Date Published: 9 October 2018
PDF: 8 pages
Proc. SPIE 10795, Electro-Optical and Infrared Systems: Technology and Applications XV, 107950W (9 October 2018); doi: 10.1117/12.2325584
Show Author Affiliations
Chen-sheng Wang, Wuhan National Lab. for Optoelectronics (China)
Guowei Jia, Wuhan National Lab. for Optoelectronics (China)
Debin Pan, Wuhan National Lab. for Optoelectronics (China)
Zhijie Zhang, Wuhan National Lab. for Optoelectronics (China)
Hai Tan, Wuhan National Lab. for Optoelectronics (China)


Published in SPIE Proceedings Vol. 10795:
Electro-Optical and Infrared Systems: Technology and Applications XV
David A. Huckridge; Helge Bürsing; Duncan L. Hickman, Editor(s)

© SPIE. Terms of Use
Back to Top