Share Email Print

Proceedings Paper

Metric nonlinearities of microchannel plate detectors
Author(s): Donald M. Hassler; Gary J. Rottman; George M. Lawrence
Format Member Price Non-Member Price
PDF $17.00 $21.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Metric nonlinearities in microchannel plate detectors have been mapped using a small spot of UV light scanned across the detector. The centroid of the detected image is accurately located, and corrections to the wavelength scale are made to determine the precise absolute Doppler shifts of the solar emission lines. The possible causes of the observed nonlinearities are briefly discussed.

Paper Details

Date Published: 1 November 1990
PDF: 7 pages
Proc. SPIE 1344, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy, (1 November 1990); doi: 10.1117/12.23251
Show Author Affiliations
Donald M. Hassler, Univ. of Colorado (United States)
Gary J. Rottman, Univ. of Colorado (United States)
George M. Lawrence, Univ. of Colorado (United States)

Published in SPIE Proceedings Vol. 1344:
EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy
Oswald H. W. Siegmund; Hugh S. Hudson, Editor(s)

© SPIE. Terms of Use
Back to Top