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Proceedings Paper

Background reduction in microchannel plates
Author(s): John H. Chappell; Rachel K. Martin; Stephen S. Murray; Martin V. Zombeck
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Paper Abstract

The source of an observed diffuse, time-varying structured background component in both bare and coated microchannel plates (MPCs) is investigated. The effects of MCP operating voltages, MCP gain characteristics, pressure, electrical contacts, and physical shielding on this background component are addressed. Various techniques to reduce this background are considered.

Paper Details

Date Published: 1 November 1990
PDF: 7 pages
Proc. SPIE 1344, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy, (1 November 1990); doi: 10.1117/12.23249
Show Author Affiliations
John H. Chappell, Harvard-Smithsonian Ctr. for Astrophysics (United States)
Rachel K. Martin, Harvard-Smithsonian Ctr. for Astrophysics (United States)
Stephen S. Murray, Harvard-Smithsonian Ctr. for Astrophysics (United States)
Martin V. Zombeck, Harvard-Smithsonian Ctr. for Astrophysics (United States)


Published in SPIE Proceedings Vol. 1344:
EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy
Oswald H. W. Siegmund; Hugh S. Hudson, Editor(s)

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