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Proceedings Paper

Development of energy dispersive x-ray diffraction system for identifying dangerous materials
Author(s): Yifan Chen; Xin Wang; Baozhong Mu; Qinghua Song
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Paper Abstract

Energy dispersive X-ray diffraction (EDXRD) is proposed to be a promising technique for identifying dangerous materials. This paper focuses on the development of the EDXRD system. A high-energy-resolution system using a room temperature detector was established. The diffraction angle of the system was adjustable depending on the detected samples and some experiments were carried out to study the suitable diffraction angle for different samples. At a nominal diffraction angle of 5°, the energy resolution of the system was approximately 6-9%. The system could effectively inspect the concealed samples and obtain the distinguishable profiles through the packaging. These experimental results demonstrated that the EDXRD system could satisfy the requirement of security inspection.

Paper Details

Date Published: 8 October 2018
PDF: 6 pages
Proc. SPIE 10802, Counterterrorism, Crime Fighting, Forensics, and Surveillance Technologies II, 1080202 (8 October 2018); doi: 10.1117/12.2324616
Show Author Affiliations
Yifan Chen, MOE Key Lab. of Advanced Micro-Structured Materials (China)
Tongji Univ. (China)
Xin Wang, MOE Key Lab. of Advanced Micro-Structured Materials (China)
Tongji Univ. (China)
Baozhong Mu, MOE Key Lab. of Advanced Micro-Structured Materials (China)
Tongji Univ. (China)
Qinghua Song, MOE Key Lab. of Advanced Micro-Structured Materials (China)
Tongji Univ. (China)


Published in SPIE Proceedings Vol. 10802:
Counterterrorism, Crime Fighting, Forensics, and Surveillance Technologies II
Henri Bouma; Radhakrishna Prabhu; Robert James Stokes; Yitzhak Yitzhaky, Editor(s)

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