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Proceedings Paper

Profile measurements for specular objects using binary-encoded patterns
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Paper Abstract

A full-field method using fringe patterns to identify the profile of a specular surface is presented. A virtual image of the fringe pattern is formed by the specular surface. The specular surface deforms the image of fringe pattern. Thus, phase of the deformed fringes can be utilized to retrieve the profile of the inspected surface.

Paper Details

Date Published: 4 September 2018
PDF: 6 pages
Proc. SPIE 10755, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications XII, 1075513 (4 September 2018); doi: 10.1117/12.2323815
Show Author Affiliations
Wei-Hung Su, National Sun Yat-Sen Univ. (Taiwan)
Sih-Yue Chen, National Sun Yat-Sen Univ. (Taiwan)


Published in SPIE Proceedings Vol. 10755:
Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications XII
Shizhuo Yin; Ruyan Guo, Editor(s)

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