Share Email Print
cover

Proceedings Paper • new

Biometric evaluation of palmlines by microstrip line networks
Author(s): Bogdan-Mihai Gavriloaia; Mariuca Gavriloaia; Marian Novac; Nicolae-Dragoş Militaru; Nicolae Vizireanu
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Today issue of security becomes luma increasingly important, with implications for all sectors of activity. Reported at the scientific aspect, user identification is the primary objective under which access into buildings, financial, information, transport, health, etc. In this regard, the physical and/or behavior characteristics could be utilized to identify/verify the subject of interest. The palmprint biometrics have demonstrated their applicability as a successful biometric modality by using various feature extraction techniques. An original method of the individual identified by the analysis of the characteristics of main lines (topological size and planar arrangement) of ordinary video images is described in this paper. The method involves the use of specific methods from microwave engineering to evaluation of the main line morphometry that are modeled using microstrip lines. Also, this proposed method could be used to evaluate the vein characteristics from infrared palm images.

Paper Details

Date Published: 31 December 2018
PDF: 6 pages
Proc. SPIE 10977, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies IX, 109771Y (31 December 2018); doi: 10.1117/12.2323762
Show Author Affiliations
Bogdan-Mihai Gavriloaia, Univ. Politehnica of Bucharest (Romania)
Mariuca Gavriloaia, "Carol Davila" Univ. of Medicine and Pharmacy (Romania)
Marian Novac, Univ. of Pitesti (Romania)
Nicolae-Dragoş Militaru, Univ. Politehnica of Bucharest (Romania)
Nicolae Vizireanu, Univ. Politehnica of Bucharest (Romania)


Published in SPIE Proceedings Vol. 10977:
Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies IX
Marian Vladescu; Razvan D. Tamas; Ionica Cristea, Editor(s)

© SPIE. Terms of Use
Back to Top