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Proceedings Paper

Objective crystal spectrometer for the SPECTRUM-X-gamma satellite
Author(s): Finn Erland Christensen; B. P. Byrnak; Allan Hornstrup; Shou-Hua Zhu; Herbert W. Schnopper
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Paper Abstract

The status of the Objective Crystal Spectrometer (OXS) to be flown on the Soviet Spectrum-X-Gamma satellite together with the X-ray investigation of two of the three natural crystals (LiF(220), Ge(111) and RAP(001) which are chosen as the baseline option are presented. An important result of this study is the approximately 50 percent higher resolution obtained by polishing the LiF(220) surface. The measured X-ray data has been used to determine the OXS specifications. A simulation of the performance of the OXS for the LiF(220)-case are presented. A novel design in which multilayers are coated on the LiF(220) and Ge(111) surfaces is presented. This design allows simultaneous spectroscopy in two energy bands each centered on cosmically interesting line emission regions. X-ray reflectivity measurements demonstrate that the crystal surface can be made sufficiently smooth for the application of the multilayer coating. The first X-ray reflectivity data of multilayers deposited on these surfaces are also reported.

Paper Details

Date Published: 1 November 1990
PDF: 9 pages
Proc. SPIE 1344, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy, (1 November 1990); doi: 10.1117/12.23236
Show Author Affiliations
Finn Erland Christensen, Danish Space Research Institute (Denmark)
B. P. Byrnak, Danish Space Research Institute (Denmark)
Allan Hornstrup, Danish Space Research Institute (Denmark)
Shou-Hua Zhu, Danish Space Research Institute (Denmark)
Herbert W. Schnopper, Danish Space Research Institute (Denmark)

Published in SPIE Proceedings Vol. 1344:
EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy
Oswald H. W. Siegmund; Hugh S. Hudson, Editor(s)

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