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Proceedings Paper

Coherent Raman scattering at interfaces (Conference Presentation)
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Paper Abstract

Coherent Raman scattering (CRS) is a popular technique for ultrafast spectroscopy and microscopy studies. CRS is based on a third-order nonlinear light-matter interaction, characterized by a nonlinear susceptibility with nonzero elements for bulk samples. It is challenging to perform CRS measurements at interfaces, as bulk contributions can often overwhelm. We have developed a surface-sensitive approach for CRS spectroscopy and microscopy, which enhances the sensitivity to interfacial processes by at least tenfold.

Paper Details

Date Published: 17 September 2018
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Proc. SPIE 10753, Ultrafast Nonlinear Imaging and Spectroscopy VI, 1075305 (17 September 2018); doi: 10.1117/12.2322636
Show Author Affiliations
Eric O. Potma, Univ. of California, Irvine (United States)
John Kenison, Univ. of California, Irvine (United States)


Published in SPIE Proceedings Vol. 10753:
Ultrafast Nonlinear Imaging and Spectroscopy VI
Zhiwen Liu; Demetri Psaltis; Kebin Shi, Editor(s)

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