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Proceedings Paper

Hard x-ray polarimeter utilizing Compton scattering
Author(s): Hirohisa Sakurai; Motosaku Noma; H. Niizeki
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Paper Abstract

A prototype polarimeter with a 50 mm diameter has been constructed. With polarized x-rays from a simple polarizer, the detection efficiency and modulation factor of the polarimeter with a 40 mm thick scatterer were 3.2% and 0.57%, respectively, at 60 keV. The fabrication and performance of the polarimeter and polarizer are presented.

Paper Details

Date Published: 1 February 1991
PDF: 7 pages
Proc. SPIE 1343, X-Ray/EUV Optics for Astronomy, Microscopy, Polarimetry, and Projection Lithography, (1 February 1991); doi: 10.1117/12.23225
Show Author Affiliations
Hirohisa Sakurai, Yamagata Univ. (United States)
Motosaku Noma, Yamagata Univ. (Japan)
H. Niizeki, Yamagata Univ. (Japan)


Published in SPIE Proceedings Vol. 1343:
X-Ray/EUV Optics for Astronomy, Microscopy, Polarimetry, and Projection Lithography

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