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Proceedings Paper

Machine vision inspection of technical ceramics
Author(s): David R. Patek; Kenneth W. Tobin; L. Jachter
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Paper Abstract

Coors Ceramics Company produces flat rectangular ceramic substrates for technical applications. Presently, finished substrates are inspected by human inspectors for dimensional tolerance and for the absence of a variety of possible surface defects. In a two-phase effort, we developed a system that could measure part dimensional parameters and inspect for surface defects. Dimensional parameters include part width, length, edge straightness, and corner perpendicularity. Surface defects include surface contamination, blemishes, open cracks, edge chips, burrs, pits, dents, ridges, blisters, and hairline cracks. We employed highly parallel pipeline image processing hardware to achieve a throughput rate of 1 part every 2 seconds.

Paper Details

Date Published: 21 February 1996
PDF: 5 pages
Proc. SPIE 2665, Machine Vision Applications in Industrial Inspection IV, (21 February 1996); doi: 10.1117/12.232246
Show Author Affiliations
David R. Patek, Oak Ridge National Lab. (United States)
Kenneth W. Tobin, Oak Ridge National Lab. (United States)
L. Jachter, Coors Ceramics Co. (United States)


Published in SPIE Proceedings Vol. 2665:
Machine Vision Applications in Industrial Inspection IV
A. Ravishankar Rao; Ning Chang, Editor(s)

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