Share Email Print
cover

Proceedings Paper

Design and characterization of a new absolute diffuse reflectance reference instrument at the NRC
Author(s): Luke J. Sandilands; Eric Côté; Joanne C. Zwinkels
Format Member Price Non-Member Price
PDF $17.00 $21.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Absolute diffuse reflectance measurements may be carried out by means of both integrating sphere and goniometer- based methods. At the National Research Council of Canada, the scale of absolute diffuse spectral reflectance is currently realized in the UV/VIS/NIR range using the modified Sharp-Little integrating sphere method. To ex- tend the wavelength range and improve instrument performance, a new absolute reflectometer facility is presently being constructed. The new system features a monochromator-based tunable light source, interchangeable detector systems (PMT, Si, and extended InGaAs) and a custom polytetrafluoroethylene integrating sphere. Aspects of the sphere aimed at mitigating the effects of sphere asymmetry and sample recess will be discussed. Data characterizing the wavelength scale, bandpass, and linearity of the new system will also be presented.

Paper Details

Date Published: 4 September 2018
PDF: 8 pages
Proc. SPIE 10750, Reflection, Scattering, and Diffraction from Surfaces VI, 107500G (4 September 2018); doi: 10.1117/12.2322361
Show Author Affiliations
Luke J. Sandilands, National Research Council Canada (Canada)
Eric Côté, National Research Council Canada (Canada)
Joanne C. Zwinkels, National Research Council Canada (Canada)


Published in SPIE Proceedings Vol. 10750:
Reflection, Scattering, and Diffraction from Surfaces VI
Leonard M. Hanssen, Editor(s)

© SPIE. Terms of Use
Back to Top