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Proceedings Paper

Bragg crystal polarimeter for the Spectrum-X-Gamma misson
Author(s): Jeff Holley; Eric H. Silver; Klaus Ziock; Robert Novick; Philip E. Kaaret; Martin C. Weisskopf; Ronald F. Elsner; Jeffrey W. Beeman
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Paper Abstract

We are designing a Bragg crystal polarimeter for the focal plane of the SODART telescope on the Spectrum-XGamma mission. A mosaic graphite crystal will be oriented at 45 0 to the optic axis of the telescope, thereby preferentially reflecting those x-rays which satisfy the Bragg condition and have electric vectors that are perpendicular to the plane defmed by the incident and reflected photons. The reflected x-rays will be detected by an imaging proportional counter with the image providing direct x-ray aspect information. The crystal will be 50 jtm thick to allow x-rays with energies □ 4 keV to be transmitted to a lithium block mounted below the graphite. The lithium is used to measure the polarization of these high energy x-rays by exploiting the polarization dependence of Thomson scattering. The development of thin mosaic graphite crystals is discussed and recent reflectivity, transmission, and uniformity measurements are presented.

Paper Details

Date Published: 1 February 1991
PDF: 12 pages
Proc. SPIE 1343, X-Ray/EUV Optics for Astronomy, Microscopy, Polarimetry, and Projection Lithography, (1 February 1991); doi: 10.1117/12.23219
Show Author Affiliations
Jeff Holley, Lawrence Livermore National Lab. (United States)
Eric H. Silver, Lawrence Livermore National Lab. (United States)
Klaus Ziock, Lawrence Livermore National Lab. (United States)
Robert Novick, Columbia Univ. (United States)
Philip E. Kaaret, Columbia Univ. (United States)
Martin C. Weisskopf, NASA/Marshall Space Flight Ctr. (United States)
Ronald F. Elsner, NASA/Marshall Space Flight Ctr. (United States)
Jeffrey W. Beeman, Lawrence Berkeley Lab. (United States)


Published in SPIE Proceedings Vol. 1343:
X-Ray/EUV Optics for Astronomy, Microscopy, Polarimetry, and Projection Lithography

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