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Proceedings Paper

Angular magnetoresistance of textured thin-film conductors
Author(s): P. Berdahl
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Paper Abstract

The angular magnetoresistance technique is proving to be a highly useful tool for the characterization of texture in thin film and other conductors composed of high-Tc superconductors This qualitative technique identifies the predominant orientation of crystallites by resistance dips which occur as a sample is rotated in a magnetic field. These dips occurs when the magnetic field is aligned parallel to the copper-oxide planes. We give some illustrative examples of the technique. It is particularly useful when x-ray diffraction is difficult due to small sample size, coating on the sample, or degeneracy of x-ray diffraction peaks.

Paper Details

Date Published: 1 March 1992
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Proc. SPIE 1597, Progress in High-Temperature Superconducting Transistors and Other Devices II, (1 March 1992); doi: 10.1117/12.2321838
Show Author Affiliations
P. Berdahl, Univ. of California, Berkeley (United States)


Published in SPIE Proceedings Vol. 1597:
Progress in High-Temperature Superconducting Transistors and Other Devices II

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