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Proceedings Paper

Fault tolerance of opto-electronic neural networks
Author(s): Anjan K. Ghosh
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Paper Abstract

Many ideas on opto-electronic realizations of various neural networks have been described over the last few years. Most of them use analog optical devices and have been shown to work satisfactorily as simple content addressable memories. An important question is how much of the faults and defects in the storage and retrieval systems, that is, the spatial and temporal errors in the spatial light modulators or the photorefractive arrays and the detector arrays these neural network realizations can tolerate. One measure of fault tolerance is the probability of correct retrieval or classification when the network is used as a content addressable memory. Using recent theories we will derive upper bounds to the probability of errors in various popular opto-electronic neural network realizations as a function of the size, capacity, and the magnitude of spatial and temporal errors. Guidelines on the design and implementations of opto-electronic neural networks will be derived.

Paper Details

Date Published: 1 December 1991
Proc. SPIE 1563, Optical Enhancements to Computing Technology, (1 December 1991); doi: 10.1117/12.2321724
Show Author Affiliations
Anjan K. Ghosh, Univ. of Iowa (United States)

Published in SPIE Proceedings Vol. 1563:
Optical Enhancements to Computing Technology
John A. Neff, Editor(s)

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