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Proceedings Paper

Retardance polarization measurement based on a dual rotating polarizer arrangement
Author(s): David I. Serrano-García; Humberto Macías-Mendoza; Jorge L. Flores; Guillermo García-Torales; Gelizlte A. Parra-Escamilla; Antonio Muñoz
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Paper Abstract

We present a polarization sensitive measurement focused on retrieve elliptical phase retardation properties. The system is based on rotating two linear polarizers. And a demodulation algorithm is proposed to retrieve a partial matrix of Muller from the intensity output signal. The polarimetry setup also employs a monochrome camera as detection system and a HeNe laser as light source. Simulation and experimental results in transparent samples are presented showing the feasibility of the measurement and the potential usage in a multiwavelength arrangement.

Paper Details

Date Published: 18 September 2018
PDF: 8 pages
Proc. SPIE 10765, Infrared Remote Sensing and Instrumentation XXVI, 107650N (18 September 2018); doi: 10.1117/12.2321676
Show Author Affiliations
David I. Serrano-García, Univ. of Guadalajara (Mexico)
Humberto Macías-Mendoza, Univ. of Guadalajara (Mexico)
Jorge L. Flores, Univ. of Guadalajara (Mexico)
Guillermo García-Torales, Univ. of Guadalajara (Mexico)
Gelizlte A. Parra-Escamilla, Univ. of Guadalajara (Mexico)
Antonio Muñoz, Univ. de Guadalajara (Mexico)


Published in SPIE Proceedings Vol. 10765:
Infrared Remote Sensing and Instrumentation XXVI
Marija Strojnik; Maureen S. Kirk, Editor(s)

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