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Polarized reflectivity for quantitative crystallography of alpha-Titanium
Author(s): Brian G. Hoover; Jonathan H. Turner; Brian J. Ritter; Joseph R. Michael; Michael D. Uchic
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Paper Abstract

A technique is introduced to extend traditional polarized-light microscopy to obtain quantitative c-axis orien- tation images of reflective non-cubic crystal grains such as a titanium. The technique is based on multiple generalized illumination and detection states in a laser polarimeter and a physical model mapping resulting im- age irradiance to crystal orientation, and is demonstrated by comparing relative-orientation images with EBSD orientation maps of a Ti-6Al-4V sample. The new technique is shown to be somewhat more tolerant than EBSD to mechanically-induced surface roughness and deformation, although grain contrast for a Ti-7Al sample was be only weakly correlated with roughness as measured by an AFM.

Paper Details

Date Published: 20 March 2019
PDF: 4 pages
Proc. SPIE 10750, Reflection, Scattering, and Diffraction from Surfaces VI, 107500D (20 March 2019); doi: 10.1117/12.2321601
Show Author Affiliations
Brian G. Hoover, Advanced Optical Technologies (United States)
Jonathan H. Turner, Advanced Optical Technologies (United States)
Brian J. Ritter, Advanced Optical Technologies (United States)
Joseph R. Michael, Sandia National Labs. (United States)
Michael D. Uchic, Air Force Research Lab. (United States)


Published in SPIE Proceedings Vol. 10750:
Reflection, Scattering, and Diffraction from Surfaces VI
Leonard M. Hanssen, Editor(s)

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