Share Email Print

Proceedings Paper

Comparison of resolution estimation methods in optical microscopy
Author(s): Jakub Pospíšil; Karel Fliegel; Jan Švihlík; Miloš Klíma
Format Member Price Non-Member Price
PDF $17.00 $21.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Super-resolution (SR) microscopy is a powerful technique which enhances the resolution of optical microscopes beyond the diffraction limit. Recent SR methods achieve the resolution of 100 nm. Theoretical resolution enhancement can be mathematically defined. However, the final resolution in the real image can be influenced by technical limitations. Evaluation of resolution in a real sample is essential to assess the performance of an SR technique. Several image based resolution limit evaluation methods exist, but the determination of cutoff frequency is still a challenging task. In order to compare the efficiency of assessing resolution methods, the reference estimation technique is necessary. There exist several conventional methods in digital image processing. In this paper, the most common resolution measurement techniques used in the optical microscopy imaging are presented and their performance compared.

Paper Details

Date Published: 17 September 2018
PDF: 8 pages
Proc. SPIE 10752, Applications of Digital Image Processing XLI, 107522Q (17 September 2018); doi: 10.1117/12.2321301
Show Author Affiliations
Jakub Pospíšil, Czech Technical Univ. in Prague (Czech Republic)
Karel Fliegel, Czech Technical Univ. in Prague (Czech Republic)
Jan Švihlík, Univ. of Chemistry and Technology (Czech Republic)
Czech Technical Univ. in Prague (Czech Republic)
Miloš Klíma, Czech Technical Univ. in Prague (Czech Republic)

Published in SPIE Proceedings Vol. 10752:
Applications of Digital Image Processing XLI
Andrew G. Tescher, Editor(s)

© SPIE. Terms of Use
Back to Top