Share Email Print

Proceedings Paper

Precision surface metrology and phase imaging based on femtosecond microwave photonics (Conference Presentation)
Author(s): Kebin Shi
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Precisely detecting and controlling time jitter of femtosecond laser pulse train can enable high resolution phase measurement by using time of flight (TOF) scheme. In this presentation, we will introduce our recent progresses on precision surface metrology and phase imaging by utilizing high resolution synchronization between radio frequency reference source and femtosecond laser pulse train generated in a passively mode locked fiber laser.

Paper Details

Date Published: 17 September 2018
Proc. SPIE 10753, Ultrafast Nonlinear Imaging and Spectroscopy VI, 107530Z (17 September 2018); doi: 10.1117/12.2321297
Show Author Affiliations
Kebin Shi, Peking Univ. (China)

Published in SPIE Proceedings Vol. 10753:
Ultrafast Nonlinear Imaging and Spectroscopy VI
Zhiwen Liu; Demetri Psaltis; Kebin Shi, Editor(s)

© SPIE. Terms of Use
Back to Top