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Proceedings Paper

Determination of the voltage-dependent dielectric properties of piezoelectric materials with a high-voltage/high-power electromechanical impedance analyzer
Author(s): R. Montes; Kevin E. Castanien; Chen Liang; Mathieu V.D. Bergh
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Paper Abstract

The dielectric properties of piezoelectric materials are important in many applications of piezoelectric materials, such as active structural control, underwater sonar, dielectric insulator, etc. The experimental measurement of dielectric properties of materials is usually done using commercial electrical impedance analyzer, LCR meter, or network analyzer, such as an HP 4194 impedance analyzer. The excitation voltage of these commercial analyzers is generally very low, e.g., 1.5 volts rms or under. However, the dielectric properties of piezoelectric materials (both dielectric constant and dielectric loss factor) can be very sensitive to the level of applied electric voltage (field). Since virtually all the applications of piezoelectric materials are under high field, it is important to develop measurement techniques to determine the voltage dependent dielectric material properties. This paper introduces a high- voltage/high-power electromechanical impedance analyzer developed based on a commercial electrical power analyzer/phase angle multimeter. The developed analyzer is then used to determine the dielectric constant and dielectric loss factor of G1195 PZT. The measurement results, dielectric constant and loss factor as a function of applied electric field, frequency, and ambient temperatures, are presented in the paper.

Paper Details

Date Published: 9 February 1996
PDF: 9 pages
Proc. SPIE 2716, Smart Structures and Materials 1996: Smart Materials Technologies and Biomimetics, (9 February 1996); doi: 10.1117/12.232125
Show Author Affiliations
R. Montes, San Diego State Univ. (United States)
Kevin E. Castanien, San Diego State Univ. (United States)
Chen Liang, San Diego State Univ. (United States)
Mathieu V.D. Bergh, Xitron Technologies, Inc. (United States)


Published in SPIE Proceedings Vol. 2716:
Smart Structures and Materials 1996: Smart Materials Technologies and Biomimetics
Andrew Crowson, Editor(s)

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