Share Email Print
cover

Proceedings Paper • new

Properties of Cd0.90-xMnxZn0.10Te (x = 0.10, 0.20) crystals grown by Vertical Bridgman method
Author(s): V. Kopach; O. Kopach; A. Kanak; L. Shcherbak; P. Fochuk; A. E. Bolotnikov; R. B. James
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

In this paper, correlation between CMZT melt state and structure properties of crystals, grown by vertical Bridgman method, was investigated. The Cd0.9-xMnxZn0.1Te crystals with various Mn composition (x = 0.1; 0.2) were grown by two-step preparation method from high purity elemental components. We have conducted series of crystal growth runs with different melt superheating degree over the alloys melting temperature. As a result, we have got the ingots with various crystalline structures and properties. It was concluded that worth crystalline structure had the bulks which were grown from the melt with lowest superheating degree. We have determined also that band gap rose (from 1.67 at x=0.1 to 1.79 eV at x=0.2) with Mn content increasing.

Paper Details

Date Published: 13 September 2018
PDF: 8 pages
Proc. SPIE 10762, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XX, 1076212 (13 September 2018); doi: 10.1117/12.2320676
Show Author Affiliations
V. Kopach, Yuriy Fedkovych Chernivtsi National Univ. (Ukraine)
O. Kopach, Yuriy Fedkovych Chernivtsi National Univ. (Ukraine)
A. Kanak, Yuriy Fedkovych Chernivtsi National Univ. (Ukraine)
L. Shcherbak, Yuriy Fedkovych Chernivtsi National Univ. (Ukraine)
P. Fochuk, Yuriy Fedkovych Chernivtsi National Univ. (Ukraine)
A. E. Bolotnikov, Brookhaven National Lab. (United States)
R. B. James, Savannah River National Lab. (United States)


Published in SPIE Proceedings Vol. 10762:
Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XX
Stephen A. Payne; Ralph B. James; Arnold Burger; Michael Fiederle, Editor(s)

© SPIE. Terms of Use
Back to Top