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Proceedings Paper

Super-resolution mapping of the local density of states with single-molecule and fluorescence lifetime imaging microscopy (Conference Presentation)
Author(s): Ignacio Izeddin; Dorian Bouchet; Jules Scholler; Valentina Krachmalnicoff

Paper Abstract

We have developed a far-field optical approach capable of mapping the local density of states (LDOS) of plasmonic structures with a spatial resolution in the order of ~10nm, well below the diffraction limit of light. Our method is based on the simultaneous localization of single fluorescent emitters with an EM-CCD camera, and the detection of their fluorescence lifetime with a time-resolved avalanche photodiode. This approach is compatible with unknown and non-periodic samples, as it makes use of a dense labeling strategy with photoactivatable fluorophores who are stochastically activated over time. We demonstrate the performance of our technique by studying the lifetime reduction induced by a silver nanowire, obtaining a super-resolved mapping of the LDOS with a localization precision of 6 nm and a temporal resolution down to 100 ps. We believe that our technique, which can be implemented in any wide-field inverted microscope, does not require scanning parts, and performs far-field measurements at the molecular level, opens up a wide range of applications spanning from nanophotonics to biological imaging.

Paper Details

Date Published: 17 September 2018
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Proc. SPIE 10722, Plasmonics: Design, Materials, Fabrication, Characterization, and Applications XVI, 107221L (17 September 2018); doi: 10.1117/12.2320649
Show Author Affiliations
Ignacio Izeddin, Institut Langevin Ondes et Images, ESPCI de la Ville de Paris (France)
Dorian Bouchet, Institut Langevin Ondes et Images, ESPCI de la Ville de Paris (France)
Jules Scholler, Institut Langevin Ondes et Images, ESPCI de la Ville de Paris (France)
Valentina Krachmalnicoff, Institut Langevin Ondes et Images, ESPCI de la Ville de Paris (France)


Published in SPIE Proceedings Vol. 10722:
Plasmonics: Design, Materials, Fabrication, Characterization, and Applications XVI
Din Ping Tsai; Takuo Tanaka, Editor(s)

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