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Proceedings Paper

Design and fabrication of thin-film coatings for advanced radiation imager onboard new-generation geostationary meteorological satellite (Conference Presentation)
Author(s): Weibo Duan; Daqi LI; Baojian Liu; Deming Yu; Dingquan Liu
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Paper Abstract

China has started to develop its geostationary meteorological satellites and associated ground application systems since the 1980s. In the past 20 years, 6 FY-2 satellites were launched and put into application. About 10 years ago, China had planned to develop a new generation geostationary satellite, and the first one, named FY-4A, was launched on December 11, 2016. The Advanced Radiation Imager, one of the observing instruments onboard FY-4A meteorological satellite, has 14 optical channels with the spectral range cover from 0.45µm to 13.8µm. Five kinds of optical coating components, including high reflectance mirrors, dichroic beam splitters, lens, optical windows and bandpass filters, are used to construct the complex optical system. Metal and dielectric thin film materials are selected to design and fabricate these optical coatings. The spectrum measurement, reliability tests and simulated space environment tests are carried out, respectively. The images received by ground station indicate that optical coatings are competent to the application of Advanced Radiation Imager.

Paper Details

Date Published: 17 September 2018
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Proc. SPIE 10742, Optical Manufacturing and Testing XII, 107420B (17 September 2018); doi: 10.1117/12.2320446
Show Author Affiliations
Weibo Duan, Shanghai Institute of Technical Physics of the Chinese Academy of Sciences (China)
Daqi LI, Shanghai Institute of Technical Physics of the Chinese Academy of Sciences (China)
Baojian Liu, Shanghai Institute of Technical Physics of the Chinese Academy of Sciences (China)
Deming Yu, Shanghai Institute of Technical Physics of the Chinese Academy of Sciences (China)
Dingquan Liu, Shanghai Institute of Technical Physics of the Chinese Academy of Sciences (China)


Published in SPIE Proceedings Vol. 10742:
Optical Manufacturing and Testing XII
Ray Williamson; Dae Wook Kim; Rolf Rascher, Editor(s)

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