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Proceedings Paper

Ultra-High-Resolution XUV Spectroheliograph II: predicted performance
Author(s): Arthur B. C. Walker; Joakim F. Lindblom; J. Gethyn Timothy; Maxwell J. Allen; Craig Edward DeForest; Charles C. Kankelborg; Ray H. O'Neal; Elizabeth S. Paris; Thomas D. Willis; Troy W. Barbee; Richard B. Hoover
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Paper Abstract

The phenomena to be studied with the Ultra-High Resolution XUV Spectroheliograph (UHRXS) which will be included into the instrumental load of the Space Station Freedom are discussed together with the characteristics of the nine multilayer Ritchey-Chretien telescopes constituting the UHRXS system. The telescopes will cover a spectral range from about 70 A to about 300 A. Each telescope will be able to isolate emission line multiplets excited over a narrow temperature range, providing images of diagnostic quality covering structures in the solar atmosphere ranging from T of about 50,000 K to 30,000,000 K. One of the nine UHRXS telescopes is configured as a coronagraph to allow observations to 6 solar radii beyond the solar limb. The paper presents an analysis of the expected sensitivity and resolving power of the UHRXS telescopes, and the diagnostic response of the various UHRXS instruments to structures in the solar atmosphere between 10,000 K and 100,000,000 K.

Paper Details

Date Published: 1 February 1991
PDF: 15 pages
Proc. SPIE 1343, X-Ray/EUV Optics for Astronomy, Microscopy, Polarimetry, and Projection Lithography, (1 February 1991); doi: 10.1117/12.23204
Show Author Affiliations
Arthur B. C. Walker, Stanford Univ. (United States)
Joakim F. Lindblom, Stanford Univ. (United States)
J. Gethyn Timothy, Stanford Univ. (United States)
Maxwell J. Allen, Stanford Univ. (United States)
Craig Edward DeForest, Stanford Univ. (United States)
Charles C. Kankelborg, Stanford Univ. (United States)
Ray H. O'Neal, Stanford Univ. (United States)
Elizabeth S. Paris, Stanford Univ. (United States)
Thomas D. Willis, Stanford Univ. (United States)
Troy W. Barbee, Lawrence Livermore National Lab. (United States)
Richard B. Hoover, NASA/Marshall Space Flight Ctr. (United States)

Published in SPIE Proceedings Vol. 1343:
X-Ray/EUV Optics for Astronomy, Microscopy, Polarimetry, and Projection Lithography

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