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Proceedings Paper

Effect of aberration on the electric field orientation around the focus of a polarized light beam
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Paper Abstract

A polarized light scanning optical microscopy is an important imaging technique popular for its ability to determine the information on molecular orientation of the sample being studied. The determination of the molecular orientation directly depends on the electric field orientation around the focus of a lens, which is used to focus the light to illuminate the sample. In this paper, we present the effect on the electric field orientation at the focal plane of the lens due to the presence of a few primary optical aberration present in the light beam.

Paper Details

Date Published: 18 September 2018
PDF: 7 pages
Proc. SPIE 10772, Unconventional and Indirect Imaging, Image Reconstruction, and Wavefront Sensing 2018, 107720Y (18 September 2018); doi: 10.1117/12.2320177
Show Author Affiliations
Ranjan Kalita, Indian Institute of Technology Guwahati (India)
Bosanta R. Boruah, Indian Institute of Technology Guwahati (India)


Published in SPIE Proceedings Vol. 10772:
Unconventional and Indirect Imaging, Image Reconstruction, and Wavefront Sensing 2018
Jean J. Dolne; Philip J. Bones, Editor(s)

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