Share Email Print

Proceedings Paper • new

A model of measurement error caused by non-uniform spot on four-quadrant detector
Author(s): Jun Zhang; Weixian Qian; Chen Mao; Guixia Cai; Jinqing Yang; Zewei Liu
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Aiming at the influence of the energy distribution of incident light on the traditional location algorithm of four-quadrant detector (4-QD), the generation rule of measurement error is analyzed. A model to express the energy distribution of the light spot of 4-QD is established by using characteristic parameters, and the measurement error model related to the characteristic parameters is derived. In the actual system, for different spot locations, we can use this model to fit the energy distribution, and get the spot characteristic parameters of the system, and then use it to calculate the measurement error caused by the traditional algorithm in 4-QD system. In the experiment, the energy distribution image of the incident beam is obtained by the beam quality analyzer, and the actual moving distance of the spot is compared with the calculation result of the traditional measurement algorithm. From the experimental results, it can be proved that the measurement error model of the four-quadrant detector, which is described in this paper, is consistent with the experimental results. It can further modify the calculation results of the 4-QD system in practical applications, to improve the measurement accuracy.

Paper Details

Date Published: 18 September 2018
Proc. SPIE 10766, Infrared Sensors, Devices, and Applications VIII, 107660S (18 September 2018); doi: 10.1117/12.2320043
Show Author Affiliations
Jun Zhang, Nanjing Univ. of Science and Technology (China)
Weixian Qian, Nanjing Univ. of Science and Technology (China)
Chen Mao, Xi'an Institute of Applied Optics (China)
Guixia Cai, Nanjing Univ. of Science and Technology (China)
Jinqing Yang, Nanjing Univ. of Science and Technology (China)
Zewei Liu, Nanjing Univ. of Science and Technology (China)

Published in SPIE Proceedings Vol. 10766:
Infrared Sensors, Devices, and Applications VIII
Paul D. LeVan; Priyalal Wijewarnasuriya; Arvind I. D'Souza, Editor(s)

© SPIE. Terms of Use
Back to Top