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Computational analysis of stress map variations by industrial light sources and load additions in digital photoelasticity
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Paper Abstract

In digital photoelasticity, evaluating the stress map is often affected in regions with critical values. This phenomenon is associated to color degradation effect and high fringe densities. It is a consequence of different experimental conditions, such as: type of birefringent material, relative spectral content of light source, relative spectral response of camera sensor, polarization optical elements, load application, etc. In this study field, the main goal accounts for evaluating the stress values, as better as possible, from photoelasticity images. Which turns the view towards the process that allow to acquire photoelasticity images with more complete information. This makes necessary to analyze the possible effects that each element could introduce into the photoelasticity image generation. This paper presents a computational analysis on the effect that different industrial light sources introduces for recovering the stress maps. Hence, four common industrial light sources are considered for generating the photoelasticity images. In this case, results reveal that there are light sources which represent stronger limitations for evaluating the stress, and that Such effect varies with the load increments. This approach is useful for predicting the possible effect that a light source selection could introduce into the stress evaluation process.

Paper Details

Date Published: 7 September 2018
PDF: 13 pages
Proc. SPIE 10751, Optics and Photonics for Information Processing XII, 107510G (7 September 2018); doi: 10.1117/12.2319875
Show Author Affiliations
Juan C. Briñez de León, Univ. Nacional de Colombia Sede Medellín (Colombia)
Hermes A. Fandiño, Univ. Nacional de Colombia Sede Medellín (Colombia)
Instituto Tecnológico Metropolitano (Colombia)
Alejandro Restrepo M., Univ. Nacional de Colombia Sede Medellín (Colombia)
John W. Branch, Univ. Nacional de Colombia Sede Medellín (Colombia)


Published in SPIE Proceedings Vol. 10751:
Optics and Photonics for Information Processing XII
Abdul A. S. Awwal; Khan M. Iftekharuddin; Mireya García Vázquez, Editor(s)

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