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Atomic force microscopy combined with optical tweezers (AFM/OT): characterization of micro and nanomaterial interactions
Author(s): K. Zembrzycki; T. A. Kowalewski; S. Pawlowska; J. Chrzanowska-Gizynska; M. Nowak; M. Walczak; F. Pierini
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Paper Abstract

Materials containing suspended micro- or nanomaterials are used extensively in multiple fields of research and industry. In order to understand the behavior of nanomaterials suspended in a liquid, the knowledge of particle stability and mobility is fundamental. For this reason, it is necessary to know the nanoscale solid-solid interaction and the hydrodynamic properties of the particles. In the presented research we used a hybrid Atomic Force Microscope coupled with Optical Tweezers system to measure the femtonewton scale interaction forces acting between single particles and the walls of a microchannel at different separation distances and environmental conditions. We show an important improvement in a typical detection system that increases the signal to noise ratio for more accurate position detection at very low separation distances.

Paper Details

Date Published: 7 September 2018
PDF: 6 pages
Proc. SPIE 10723, Optical Trapping and Optical Micromanipulation XV, 1072323 (7 September 2018); doi: 10.1117/12.2319732
Show Author Affiliations
K. Zembrzycki, Institute of Fundamental Technological Research (Poland)
T. A. Kowalewski, Institute of Fundamental Technological Research (Poland)
S. Pawlowska, Institute of Fundamental Technological Research (Poland)
J. Chrzanowska-Gizynska, Institute of Fundamental Technological Research (Poland)
M. Nowak, Institute of Fundamental Technological Research (Poland)
M. Walczak, Institute of Fundamental Technological Research (Poland)
F. Pierini, Institute of Fundamental Technological Research (Poland)


Published in SPIE Proceedings Vol. 10723:
Optical Trapping and Optical Micromanipulation XV
Kishan Dholakia; Gabriel C. Spalding, Editor(s)

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