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Modulation of depolarization analyzed by interferometry setup
Author(s): A. Kalbarczyk; N. Bennis; I. Merta; A. Spadlo; R. Weglowski; M. Kwiatkowska; P. Marć; L. R. Jaroszewicz
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Paper Abstract

Many optical applications requires often totally polarized light. However there are an other applications, such as optical spectrum analyzer, in which incident polarized light is undesirable. Insertion of depolarizer in such devices may stabilize the optical signal of the measured light, in order to reduce offsets in measurements. Liquid crystal are functional materials possessing anisotropies originating from their inner molecular alignment. A vertically aligned nematic liquid crystal with zero pretilts in the off state is isotropic for light impinging at normal incidence. However, the liquid crystal orientation upon electric switching is undefined; therefore the cell usually generates disordered birefringent medium related to undefined switching direction of molecules which produce random polarization of the transmitted light by liquid crystal cell, therefore depolarization effect is produced. In this work, the treatment of problems involving depolarization of incident polarized light beam passing through a depolarizing medium and general physical phenomena associated with it, will be investigated at the speckle scale. A suitable tool for this treatment will be real time Young’s interferometer constructed with a new principle including the possibility to control the fringe pattern in real time with objective to study the dynamics of speckle fluctuation. Modulation of depolarization control with an applied voltage are reported, also.

Paper Details

Date Published: 7 September 2018
PDF: 7 pages
Proc. SPIE 10834, Speckle 2018: VII International Conference on Speckle Metrology, 108340L (7 September 2018); doi: 10.1117/12.2319623
Show Author Affiliations
A. Kalbarczyk, Military Univ. of Technology (Poland)
N. Bennis, Military Univ. of Technology (Poland)
I. Merta, Military Univ. of Technology (Poland)
A. Spadlo, Military Univ. of Technology (Poland)
R. Weglowski, Military Univ. of Technology (Poland)
M. Kwiatkowska, Military Univ. of Technology (Poland)
P. Marć, Military Univ. of Technology (Poland)
L. R. Jaroszewicz, Military Univ. of Technology (Poland)


Published in SPIE Proceedings Vol. 10834:
Speckle 2018: VII International Conference on Speckle Metrology
Malgorzata Kujawińska; Leszek R. Jaroszewicz, Editor(s)

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