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PiFM vs s-SNOM: a comparative study
Author(s): Ryan M. Khan; Bongsu Kim; Eric O. Potma
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Paper Abstract

Scattering scanning near field optical microscopy (s-SNOM) is a useful tool for providing optical resolution well below the diffraction limit with chemical selectivity. s-SNOM relies on recording the scattering light of a scanning probe tip, coupling the near-field interaction to a far field photo-detector. Photo-induced force microscopy (PiFM) is a much newer technique that also provides chemical resolution well below the diffraction limit. In PiFM, the signal arises from measuring the light induced force on a scanning probe tip of a sample interacting with laser light. It measures and records all information in the near field, with no need for a photo-detector. In this presentation, we describe results comparing and contrasting s-SNOM and PiFM displaying the strengths and weaknesses of both methods.

Paper Details

Date Published: 27 February 2018
PDF: 1 pages
Proc. SPIE 10549, Complex Light and Optical Forces XII, 105491L (27 February 2018); doi: 10.1117/12.2319340
Show Author Affiliations
Ryan M. Khan, Univ. of California, Irvine (United States)
Bongsu Kim, Univ. of California, Irvine (United States)
Eric O. Potma, Univ. of California, Irvine (United States)


Published in SPIE Proceedings Vol. 10549:
Complex Light and Optical Forces XII
Enrique J. Galvez; David L. Andrews; Jesper Glückstad, Editor(s)

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