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Proceedings Paper

Performance of the Multi-Spectral Solar Telescope Array III: optical characteristics of the Ritchey-Chretien and Cassegrain Telescopes
Author(s): Richard B. Hoover; Phillip C. Baker; James B. Hadaway; R. Barry Johnson; Cynthia Peterson; David R. Gabardi; Arthur B. C. Walker; Joakim F. Lindblom; Craig Edward DeForest; Ray H. O'Neal
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Paper Abstract

The Multi-Spectral Solar Telescope Array (MSSTA) is a sounding rocket borne observatory for investigations of the Sun in the soft x-ray/EUV and FUV regimes of the electromagnetic spectrum. At soft x-ray wavelengths (),\ < 100 A), the MSSTA utilizes single reflection multilayer coated Herschelian telescopes. For selected wavelengths in the EUV (100 - 1000 A) the MSSTA employs five doubly reflecting, multilayer coated Ritchey-Chretien and two Cassegrain telescopes. In the FUV ()\ > 1000 A) the MSSTA utilizes two Ritchey-Chretien telescopes, with optics coated with thin film interference coatings. In this paper, we describe the interferometric alignment, testing, focusing, visible light testing, and optical performance characteristics of the Ritchey-Chretien and Cassegrain telescopes.

Paper Details

Date Published: 1 February 1991
PDF: 14 pages
Proc. SPIE 1343, X-Ray/EUV Optics for Astronomy, Microscopy, Polarimetry, and Projection Lithography, (1 February 1991); doi: 10.1117/12.23192
Show Author Affiliations
Richard B. Hoover, NASA/Marshall Space Flight Ctr. (United States)
Phillip C. Baker, Baker Consulting (United States)
James B. Hadaway, Ctr. for Applied Optics/Univ. of Alabama in Huntsville (United States)
R. Barry Johnson, Ctr. for Applied Optics/Univ. of Alabama in Huntsville (United States)
Cynthia Peterson, Ctr. for Applied Optics/Univ. of Alabama in Huntsville (United States)
David R. Gabardi, Univ. of Alabama/Birmingham (United States)
Arthur B. C. Walker, Stanford Univ. (United States)
Joakim F. Lindblom, Stanford Univ. (United States)
Craig Edward DeForest, Stanford Univ. (United States)
Ray H. O'Neal, Stanford Univ. (United States)


Published in SPIE Proceedings Vol. 1343:
X-Ray/EUV Optics for Astronomy, Microscopy, Polarimetry, and Projection Lithography

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