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Proceedings Paper

Recent developments in production of thin x-ray reflecting foils
Author(s): Rene Hudec; Boris Valnicek; J. Cervencl; T. Gerstman; Adolf Van Inneman; Pavel Nejedly; Lubomir Svatek
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Paper Abstract

Progress in the development of high quality X-ray reflecting foils for high throughput X-ray imaging experiments is briefly given and discussed.

Paper Details

Date Published: 1 February 1991
PDF: 2 pages
Proc. SPIE 1343, X-Ray/EUV Optics for Astronomy, Microscopy, Polarimetry, and Projection Lithography, (1 February 1991); doi: 10.1117/12.23189
Show Author Affiliations
Rene Hudec, Astronomical Institute/Czechoslovak Academy of Sciences (Czech Republic)
Boris Valnicek, Astronomical Institute/Czechoslovak Academy of Sciences (Czech Republic)
J. Cervencl, National Institute for Materials (Czech Republic)
T. Gerstman, National Institute for Materials (Czech Republic)
Adolf Van Inneman, National Institute for Materials (Czech Republic)
Pavel Nejedly, National Institute for Materials (Czech Republic)
Lubomir Svatek, National Institute for Materials (Czech Republic)


Published in SPIE Proceedings Vol. 1343:
X-Ray/EUV Optics for Astronomy, Microscopy, Polarimetry, and Projection Lithography

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