Share Email Print
cover

Proceedings Paper

Imaging performance and tests of soft x-ray telescopes
Author(s): Eberhard Adolf Spiller; R. McCorkle; Janusz S. Wilczynski; Leon Golub; George U. Nystrom; Peter Z. Takacs; Charles W. Welch
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Photos obtained during 5 mm. of observation time from the flight of our 10 inch normal incidence soft x-ray (1 = 63.5A) telescope on September 11, 1989 are analyzed and the data are compared to the results expected from tests of the mirror surfaces. These tests cover a range of spatial periods from 25 cm to lÅ. The photos demonstrate a reduction in the scattering of the multilayer mirror compared to a single surface for scattering angles above 1 arcmin, corresponding to surface irregularities with spatial periods below 10 tim. Our results are used to predict the possible performance of future flights. Sounding rocket observations might be able to reach a resolution around 0. 1 arcsec. Higher resolutions will require flights of longer durations and improvements in mirror testing for the largest spatial penods.

Paper Details

Date Published: 1 February 1991
PDF: 11 pages
Proc. SPIE 1343, X-Ray/EUV Optics for Astronomy, Microscopy, Polarimetry, and Projection Lithography, (1 February 1991); doi: 10.1117/12.23186
Show Author Affiliations
Eberhard Adolf Spiller, IBM/Thomas J. Watson Research Ctr. (United States)
R. McCorkle, IBM/Thomas J. Watson Research Ctr. (United States)
Janusz S. Wilczynski, IBM/Thomas J. Watson Research Ctr. (United States)
Leon Golub, Harvard-Smithsonian Ctr. for Astrophysics (United States)
George U. Nystrom, Harvard-Smithsonian Ctr. for Astrophysics (United States)
Peter Z. Takacs, Brookhaven National Lab. (United States)
Charles W. Welch, Lockheed Missiles & Space Co., Inc. (United States)


Published in SPIE Proceedings Vol. 1343:
X-Ray/EUV Optics for Astronomy, Microscopy, Polarimetry, and Projection Lithography

© SPIE. Terms of Use
Back to Top