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Infrared quantum remote sensing detection imaging technology that breakthrough quantum noise limit
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Paper Abstract

Based on the basic theory, information mechanism and imaging experiment of quantum remote sensing, quantum spectral imaging and quantum detection and identification, as well as the production of principle prototype, the author conducted researches on high-sensitivity target detection of infrared optical quantum squeezing that can breakthrough quantum noise limit, high resolution imaging technical solutions and imaging principle experiment, focusing on realizing of high sensitivity long-range target detection, system composition and working principle of high-resolution imaging experimental device, infrared quantum optical squeezed light preparation and injection, and quantum noiseless amplifier, aiming to resolve relevant crucial problems, which provide technical basis for the production of engineering prototype and its experimental device. Besides, based on the project assignment, the paper firstly introduces research status at home and abroad, the development tendency, and research significance and necessity, then it emphasizes the research target, research content and key technical index, as well as the overall technical solutions, solutions and feasibility analysis for key technologies. Finally, it summarizes benefit analysis, project arrangement and outcome forms.

Paper Details

Date Published: 18 September 2018
PDF: 13 pages
Proc. SPIE 10765, Infrared Remote Sensing and Instrumentation XXVI, 1076506 (18 September 2018); doi: 10.1117/12.2318262
Show Author Affiliations
Siwen Bi, Institute of Remote Sensing and Digital Earth (China)
China Electronics Technology Corp. (China)
Youyong Liu, China Electronics Technology Corp. (China)
Zhiyong Lu, China Electronics Technology Corp. (China)
Wenqi Ma, China Electronics Technology Corp. (China)
Na Li, China Electronics Technology Corp. (China)


Published in SPIE Proceedings Vol. 10765:
Infrared Remote Sensing and Instrumentation XXVI
Marija Strojnik; Maureen S. Kirk, Editor(s)

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