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Proceedings Paper

Diffraction analysis of sidelobe characteristics of optical elements with ripple error
Author(s): Lei Zhao; Yupeng Luo; Jian Bai; Xiangdong Zhou; Juan Du; Qun Liu; Yujie Luo
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Paper Abstract

The ripple errors of the lens lead to optical damage in high energy laser system. The analysis of sidelobe on the focal plane, caused by ripple error, provides a reference to evaluate the error and the imaging quality. In this paper, we analyze the diffraction characteristics of sidelobe of optical elements with ripple errors. First, we analyze the characteristics of ripple error and build relationship between ripple error and sidelobe. The sidelobe results from the diffraction of ripple errors. The ripple error tends to be periodic due to fabrication method on the optical surface. The simulated experiments are carried out based on angular spectrum method by characterizing ripple error as rotationally symmetric periodic structures. The influence of two major parameter of ripple including spatial frequency and peak-to-valley value to sidelobe is discussed. The results indicate that spatial frequency and peak-to-valley value both impact sidelobe at the image plane. The peak-tovalley value is the major factor to affect the energy proportion of the sidelobe. The spatial frequency is the major factor to affect the distribution of the sidelobe at the image plane.

Paper Details

Date Published: 5 March 2018
PDF: 6 pages
Proc. SPIE 10710, Young Scientists Forum 2017, 1071031 (5 March 2018); doi: 10.1117/12.2317564
Show Author Affiliations
Lei Zhao, Zhejiang Univ. (China)
Yupeng Luo, Zhejiang Univ. (China)
Jian Bai, Zhejiang Univ. (China)
Xiangdong Zhou, Zhejiang Univ. (China)
Juan Du, Zhejiang Univ. (China)
Qun Liu, Zhejiang Univ. (China)
Yujie Luo, Zhejiang Univ. (China)

Published in SPIE Proceedings Vol. 10710:
Young Scientists Forum 2017
Songlin Zhuang; Junhao Chu; Jian-Wei Pan, Editor(s)

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