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High beam quality and high energy short-pulse laser with MOPA
Author(s): Quanwei Jin; Yu Pang; JianFeng Jiang; Liang Tan; Lingling Cui; Bin Wei; Yinhong Sun; Chun Tang
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Paper Abstract

A high energy, high beam quality short-pulse diode-pumped Nd:YAG master oscillator power-amplifier (MOPA) laser with two amplifier stages is demonstrated. The two-rod birefringence compensation was used as beam quality controlling methods, which presents a short-pulse energy of 40 mJ with a beam quality value of M2 = 1.2 at a repetition rate of 400Hz. The MOPA system delivers a short-pulse energy of 712.5 mJ with a pulse width of 12.4 ns.The method of spherical aberration compensation is improved the beam quality, a M2 factor of 2.3 and an optical-to-optical efficiency of 27.7% is obtained at the maximum laser out power.The laser obtained 1.4J out energy with polarization integration.

Paper Details

Date Published: 5 March 2018
PDF: 8 pages
Proc. SPIE 10710, Young Scientists Forum 2017, 107103B (5 March 2018); doi: 10.1117/12.2316797
Show Author Affiliations
Quanwei Jin, Key Lab. of Science and Technology on High Energy Laser (China)
Institute of Applied Electroncis (China)
Yu Pang, Key Lab. of Science and Technology on High Energy Laser (China)
Institute of Applied Electroncis (China)
JianFeng Jiang, Key Lab. of Science and Technology on High Energy Laser (China)
Institute of Applied Electroncis (China)
Liang Tan, Key Lab. of Science and Technology on High Energy Laser (China)
Institute of Applied Electroncis (China)
Lingling Cui, Key Lab. of Science and Technology on High Energy Laser (China)
Institute of Applied Electroncis (China)
Bin Wei, Key Lab. of Science and Technology on High Energy Laser (China)
Institute of Applied Electroncis (China)
Yinhong Sun, Key Lab. of Science and Technology on High Energy Laser (China)
Institute of Applied Electroncis (China)
Chun Tang, Key Lab. of Science and Technology on High Energy Laser (China)
Institute of Applied Electroncis (China)


Published in SPIE Proceedings Vol. 10710:
Young Scientists Forum 2017
Songlin Zhuang; Junhao Chu; Jian-Wei Pan, Editor(s)

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