Share Email Print

Proceedings Paper • new

Readout QDC for CdTe x-ray imager using direct charge treatment
Author(s): Katsuyuki Takagi; Toshiyuki Takagi; Tsuyoshi Terao; Akifumi Koike; Toru Aoki
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

X-ray imaging is popular in medical imaging, non-destructive testing and security. Main techniques of X-ray imaging with semiconductor detectors are charge accumulation and photon counting, and the photon counting is expected to identify materials at the same time with taking X-ray photograph by using energy information of X-ray photons. We proposed a direct charge handling method to build a photon counting system with energy information for X-ray imaging. This method operates the charge from the X-ray detector and converts it to encoded digital bit pattern directly without dead time of the front-end circuit. We simulated and built a proposed system to prove operating principals.

Paper Details

Date Published: 14 May 2018
PDF: 6 pages
Proc. SPIE 10656, Image Sensing Technologies: Materials, Devices, Systems, and Applications V, 106561W (14 May 2018); doi: 10.1117/12.2316419
Show Author Affiliations
Katsuyuki Takagi, Shizuoka Univ. (Japan)
ANSeeN Inc. (Japan)
Toshiyuki Takagi, ANSeeN Inc. (Japan)
Tsuyoshi Terao, Shizuoka Univ. (Japan)
ANSeeN Inc. (Japan)
Akifumi Koike, Shizuoka Univ. (Japan)
ANSeeN Inc. (Japan)
Toru Aoki, Shizuoka Univ. (Japan)

Published in SPIE Proceedings Vol. 10656:
Image Sensing Technologies: Materials, Devices, Systems, and Applications V
Nibir K. Dhar; Achyut K. Dutta, Editor(s)

© SPIE. Terms of Use
Back to Top