Share Email Print
cover

Proceedings Paper

Astigmatism-corrected flat-field XUV spectrograph and its aberration analysis
Author(s): Il Woo Choi
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

The astigmatism of a flat-field XUV spectrograph was compensated for by using a toroidal mirror. The aberration of the spectrograph system was analyzed from the wave front aberration. The performance of the spectrograph was investigated by obtaining spectra from plasmas generated by an iodine laser. The calculated and the experimental results show that the astigmatism is efficiently corrected over the entire wavelength range of 30-300 Å ; consequently, the spectrograph system can generate space-resolved spectra along the direction parallel to the grooves of the grating.

Paper Details

Date Published: 1 September 1996
PDF: 2 pages
Proc. SPIE 2778, 17th Congress of the International Commission for Optics: Optics for Science and New Technology, 2778GO (1 September 1996); doi: 10.1117/12.2316289
Show Author Affiliations
Il Woo Choi, Korea Advanced Institute of Science and Technology (Korea, Republic of)


Published in SPIE Proceedings Vol. 2778:
17th Congress of the International Commission for Optics: Optics for Science and New Technology
Joon-Sung Chang; Jai-Hyung Lee; ChangHee Nam, Editor(s)

© SPIE. Terms of Use
Back to Top