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Proceedings Paper

Measuring refractive indices from interferograms in the soft x ray range
Author(s): D. Joyeux
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Paper Abstract

The luminance1 of third generation synchrotron sources, (ALS, Elettra) and even some older ones such as NSLS (line X1A) ar BNL, and Super ACO (line 5U7) at Orsay which we are using, is now large enough to allow the practical construction of interferometers and transfer all applications of interferometry to the soft X ray domain (λ = 2-10 nm). Our purpose with the present work is to transpose to soft X rays the concept of measuring the real part n = 1-δ of the refractive index from the fact that interference patterns are shifted by eδ/λ fringes when a sample of thickness e is inserted in one arm of the interferometer. The n values of all materials in that range are quite close to unity and determination methods used so far are generally indirect and strongly affected by absorption. While of course a large imaginary part of the refractive index, i.e. the absorption, ultimately affects the interference contrast and therefore the accuracy, it does not affect the average value, which allows to expect a significant gain in accuracy from interferometry.

Paper Details

Date Published: 1 September 1996
PDF: 2 pages
Proc. SPIE 2778, 17th Congress of the International Commission for Optics: Optics for Science and New Technology, 2778GJ (1 September 1996); doi: 10.1117/12.2316284
Show Author Affiliations
D. Joyeux, Institut d'Optique, CNRS (France)


Published in SPIE Proceedings Vol. 2778:
17th Congress of the International Commission for Optics: Optics for Science and New Technology
Joon-Sung Chang; Jai-Hyung Lee; ChangHee Nam, Editor(s)

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