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Proceedings Paper

Use of standard deviation measurements for the contrast enhancement of speckle addition fringe patterns
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Paper Abstract

The electronic speckle pattern interferometer in the double pulse addition mode can be used to measure physical parameters in unstable environmental conditions. However, due to additive speckle noise the fringe patterns obtained have poor contrast. Some methods that use subtraction of addition double-pulsed fringe patterns improve fringe visibility but impose a limitation in measurement time ranges. In order to increase this range, to be limited only by the pulse separation, the contrast enhancement of double-pulsed addition fringe patterns using a spatial filter based on local standard deviation measurements is investigated. Computer simulations and experimental results are presented.

Paper Details

Date Published: 1 September 1996
PDF: 2 pages
Proc. SPIE 2778, 17th Congress of the International Commission for Optics: Optics for Science and New Technology, 2778FT (1 September 1996); doi: 10.1117/12.2316258
Show Author Affiliations
Fernando Mendoza Santoyo, Ctr. de Investigaciones en Óptica, A.C. (Mexico)


Published in SPIE Proceedings Vol. 2778:
17th Congress of the International Commission for Optics: Optics for Science and New Technology
Joon-Sung Chang; Jai-Hyung Lee; ChangHee Nam, Editor(s)

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