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Proceedings Paper

Topological phase and interpretation of the interferometer data
Author(s): V. A. Andreev
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Paper Abstract

There have been many recent manifestations. of topological phases in optics, but in the all works, both theoretical and experimental, these phases are considered only as some interesting natural phenomena. We will show that topological phases can be used for constructing the devices capable of measurement both geometrical and optical characteristics of a surface, that is combining the properties of profilometer and ellipsometer.

Paper Details

Date Published: 1 September 1996
PDF: 2 pages
Proc. SPIE 2778, 17th Congress of the International Commission for Optics: Optics for Science and New Technology, 2778F0 (1 September 1996); doi: 10.1117/12.2316229
Show Author Affiliations
V. A. Andreev, P. N. Lebedev Physical Institute (Russian Federation)


Published in SPIE Proceedings Vol. 2778:
17th Congress of the International Commission for Optics: Optics for Science and New Technology
Joon-Sung Chang; Jai-Hyung Lee; ChangHee Nam, Editor(s)

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