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Proceedings Paper

Stitching interferometry: principles and algorithms
Author(s): Y. J. Fan
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Paper Abstract

With modern commercial interferometers, high precision measurement can be made of flats and spheres.1,3 However, the interferometric measurement of aspheric surfaces may be very hard to perform. The problem is that, if the aspheric surface has a large departure of slope from the best fitting reference surface, an interferogram acquired without some sort of aspheric null elements contains too many fringes to be detected.2,3 In other words, such an interferogram is unsolvable.

Paper Details

Date Published: 1 September 1996
PDF: 2 pages
Proc. SPIE 2778, 17th Congress of the International Commission for Optics: Optics for Science and New Technology, 2778ED (1 September 1996); doi: 10.1117/12.2316206
Show Author Affiliations
Y. J. Fan, Eindhoven Univ. of Technology (Netherlands)


Published in SPIE Proceedings Vol. 2778:
17th Congress of the International Commission for Optics: Optics for Science and New Technology
Joon-Sung Chang; Jai-Hyung Lee; ChangHee Nam, Editor(s)

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