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Proceedings Paper

Analysis of z-scan technique in photorefractive crystals
Author(s): Shaoping Bian
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Paper Abstract

The far-field diffraction pattern of a photorefractive crystal under an external applied electric field in a Z-scan configuration is derived based on the analysis of the propagation of a Gaussian beam wavefront with spatial phase distortion. The effective electro-optic coefficient of a SBN:Ce crystal is determined from the Z-scan experiments. Enhanced sensitivity is predicted if the light irradiance is measured at the ofd axis positions in the far field.

Paper Details

Date Published: 1 September 1996
PDF: 2 pages
Proc. SPIE 2778, 17th Congress of the International Commission for Optics: Optics for Science and New Technology, 2778C8 (1 September 1996); doi: 10.1117/12.2316129
Show Author Affiliations
Shaoping Bian, Univ. Estadual de Campinas (Brazil)


Published in SPIE Proceedings Vol. 2778:
17th Congress of the International Commission for Optics: Optics for Science and New Technology
Joon-Sung Chang; Jai-Hyung Lee; ChangHee Nam, Editor(s)

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