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Proceedings Paper

Measurement of the linear eletro-optic effect by reflection method in Mach-Zehnder interferometer
Author(s): M. J. Shin
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Paper Abstract

A Mach-Zehnder interferometer (MZI) is adopted to measure the linear electro-optic (EO) coefficient of the poled polymer film. EO effect is measured as a function of the optical bias, the modulation voltage, and the direction of polarization.

Paper Details

Date Published: 1 September 1996
PDF: 2 pages
Proc. SPIE 2778, 17th Congress of the International Commission for Optics: Optics for Science and New Technology, 2778BE (1 September 1996); doi: 10.1117/12.2316099
Show Author Affiliations
M. J. Shin, Ewha Womans Univ. (Korea, Republic of)


Published in SPIE Proceedings Vol. 2778:
17th Congress of the International Commission for Optics: Optics for Science and New Technology
Joon-Sung Chang; Jai-Hyung Lee; ChangHee Nam, Editor(s)

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