Share Email Print

Proceedings Paper

Three wagons method to analyze ductile mode grinding processes
Author(s): Oliver Faehnle; Marius Doetz; Olaf Dambon; Eckhard Langenbach
Format Member Price Non-Member Price
PDF $17.00 $21.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Ductile mode machining is usually applied for the optical finishing operation of e.g. tungsten carbide molds to be used for precision glass molding. In this paper, we report on a process analysis of ductile mode machining analyzing the influences of critical process parameters on the level of surface roughness being generated for tungsten carbide. To that aim, a recently developed method for process optimization in optics fabrication, the three wagons method, was applied identifying critical process parameters determining the eventual level of surface roughness within the ductile process window of UPM machining. Based on the experimental data collected, a new formula was developed enabling the prediction of the level of surface roughness being generated by ductile machining. Applying this formula, an optimized set of critical process parameter values has been determined predicting a minimum level of surface roughness on tungsten carbide (CTN01L) by ductile mode material removal of about 1 nm rms which has been proven in experiment. The developed formula enables a better predictability of level of surface roughness within the process window of ductile mode machining.

Paper Details

Date Published: 15 June 2018
PDF: 9 pages
Proc. SPIE 10692, Optical Fabrication, Testing, and Metrology VI, 106920Y (15 June 2018); doi: 10.1117/12.2315337
Show Author Affiliations
Oliver Faehnle, FISBA AG (Switzerland)
Marius Doetz, Fraunhofer-Institut für Produktionstechnologie IPT (Germany)
Olaf Dambon, Fraunhofer-Institut für Produktionstechnologie IPT (Germany)
Eckhard Langenbach, FISBA AG (Switzerland)

Published in SPIE Proceedings Vol. 10692:
Optical Fabrication, Testing, and Metrology VI
Sven Schröder; Roland Geyl, Editor(s)

© SPIE. Terms of Use
Back to Top