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Proceedings Paper

Charactering lidar optical subsystem using four quadrants method
Author(s): Xiaomin Tian; Dong Liu; Jiwei Xu; Zhenzhu Wang; Bangxin Wang; Decheng Wu; Zhiqing Zhong; Chenbo Xie; Yingjian Wang
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Paper Abstract

Lidar is a kind of active optical remote sensing instruments , can be applied to sound atmosphere with a high spatial and temporal resolution. Many parameter of atmosphere can be get by using different inverse algorithm with lidar backscatter signal. The basic setup of a lidar consist of a transmitter and a receiver. To make sure the quality of lidar signal data, the lidar must be calibrated before being used to measure the atmospheric variables. It is really significant to character and analyze lidar optical subsystem because a well equiped lidar optical subsystem contributes to high quality lidar signal data. we pay close attention to telecover test to character and analyze lidar optical subsystem.The telecover test is called four quadrants method consisting in dividing the telescope aperture in four quarants. when a lidar is well configured with lidar optical subsystem, the normalized signal from four qudrants will agree with each other on some level. Testing our WARL-II lidar by four quadrants method ,we find the signals of the four basically consistent with each other both in near range and in far range. But in detail, the signals in near range have some slight distinctions resulting from overlap function, some signals distinctions are induced by atmospheric instability.

Paper Details

Date Published: 20 February 2018
PDF: 5 pages
Proc. SPIE 10697, Fourth Seminar on Novel Optoelectronic Detection Technology and Application, 106973D (20 February 2018); doi: 10.1117/12.2315183
Show Author Affiliations
Xiaomin Tian, Anhui Institute of Optics and Fine Mechanics (China)
Univ. of Science and Technology of China (China)
Dong Liu, Anhui Institute of Optics and Fine Mechanics (China)
Jiwei Xu, Anhui Institute of Optics and Fine Mechanics (China)
Univ. of Science and Technology of China (China)
Zhenzhu Wang, Anhui Institute of Optics and Fine Mechanics (China)
Bangxin Wang, Anhui Institute of Optics and Fine Mechanics (China)
Decheng Wu, Anhui Institute of Optics and Fine Mechanics (China)
Zhiqing Zhong, Anhui Institute of Optics and Fine Mechanics (China)
Chenbo Xie, Anhui Institute of Optics and Fine Mechanics (China)
Yingjian Wang, Anhui Institute of Optics and Fine Mechanics (China)
Univ. of Science and Technology of China (China)


Published in SPIE Proceedings Vol. 10697:
Fourth Seminar on Novel Optoelectronic Detection Technology and Application
Weiqi Jin; Ye Li, Editor(s)

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