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Research on spectrum broadening covering visible light of a fiber femtosecond optical frequency comb for absolute frequency measurement
Author(s): Shuai Xing; Tengfei Wu; Shuyi Li; Chuanqing Xia; Jibo Han; Lei Zhang; Chunbo Zhao
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Paper Abstract

As a bridge connecting microwave frequency and optical frequency, femtosecond laser has important significance in optical frequency measurement. Compared with the traditional Ti-sapphire femtosecond optical frequency comb, with the advantages of compact structure, strong anti-interference ability and low cost, the fiber femtosecond optical frequency comb has a wider application prospect. An experiment of spectrum broadening in a highly nonlinear photonic crystal fiber pumped by an Er-fiber mode-locked femtosecond laser is studied in this paper. Based on optical amplification and frequency doubling, the central wavelength of the output spectrum is 780nm and the average power is 232mW. With the femtosecond pulses coupled into two different photonic crystal fibers, the coverage of visible spectrum is up to 500nm-960nm. The spectral shape and width can be optimized by changing the polarization state for satisfying the requirments of different optical frequencies measurement.

Paper Details

Date Published: 5 March 2018
PDF: 7 pages
Proc. SPIE 10710, Young Scientists Forum 2017, 107100S (5 March 2018); doi: 10.1117/12.2314723
Show Author Affiliations
Shuai Xing, Beijing Changcheng Institute of Metrology and Measurement (China)
Tengfei Wu, Beijing Changcheng Institute of Metrology and Measurement (China)
Shuyi Li, Beijing Changcheng Institute of Metrology and Measurement (China)
Chuanqing Xia, Beijing Changcheng Institute of Metrology and Measurement (China)
Jibo Han, Beijing Changcheng Institute of Metrology and Measurement (China)
Lei Zhang, Beijing Changcheng Institute of Metrology and Measurement (China)
Chunbo Zhao, Beijing Changcheng Institute of Metrology and Measurement (China)


Published in SPIE Proceedings Vol. 10710:
Young Scientists Forum 2017
Songlin Zhuang; Junhao Chu; Jian-Wei Pan, Editor(s)

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