Share Email Print
cover

Proceedings Paper • new

Aperiodic x-ray multilayer interference coatings with high reflectance and large field of view
Author(s): Catherine Burcklen; Tom Pardini; Jennifer Alameda; Jeff Robinson; Eberhard Spiller; Chris Walton; Paul Mirkarimi; Stefan P. Hau-Riege; Regina Soufli
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Aperiodic multilayer interference coatings are of particular interest for a variety of hard x-ray applications, including target diagnostics, astrophysics, high energy physics and free-electron lasers. Such applications require large field of view along with the highest achievable photon efficiency for their optical components, pushing reflective multilayer coatings to their limits. This work investigates the design, experimental performance, modeling and optimization of high-reflectance aperiodic multilayers. Multilayer design starts with the implementation of an analytical method developed in the literature, which calculates the most efficient coating, featuring the highest achievable reflectivity with the least number of layers. A numerical optimization step is added for smoothing of high-frequency "ripples" or to comply with any specific requirement in terms of spectral or angular response. The design process also includes material-dependent specificities (e.g. typical roughness, interlayer formation) which are often crucial for accurate prediction of actual coating performance. We applied this method to develop novel high-reflectance broadband multilayers at 17.4 keV (Mo Kα emission line), working at angles of grazing incidence up to 0.6 degrees. The design methods employed in this work are presented, as well as the results obtained for a few multilayer systems, including Mo/Si, W/Si and W/SiC.

Paper Details

Date Published: 5 June 2018
PDF: 10 pages
Proc. SPIE 10691, Advances in Optical Thin Films VI, 106910U (5 June 2018); doi: 10.1117/12.2314257
Show Author Affiliations
Catherine Burcklen, Lawrence Livermore National Lab. (United States)
Tom Pardini, Lawrence Livermore National Lab. (United States)
Jennifer Alameda, Lawrence Livermore National Lab. (United States)
Jeff Robinson, Lawrence Livermore National Lab. (United States)
Eberhard Spiller, Lawrence Livermore National Lab. (United States)
Chris Walton, Lawrence Livermore National Lab. (United States)
Paul Mirkarimi, Lawrence Livermore National Lab. (United States)
Stefan P. Hau-Riege, Lawrence Livermore National Lab. (United States)
Regina Soufli, Lawrence Livermore National Lab. (United States)


Published in SPIE Proceedings Vol. 10691:
Advances in Optical Thin Films VI
Michel Lequime; H. Angus Macleod; Detlev Ristau, Editor(s)

© SPIE. Terms of Use
Back to Top