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Validation of a CCD cosmic ray event simulator against Gaia in-orbit data
Author(s): Lionel Garcia; Thibaut Prod'homme; David Lucsanyi; Alex Short; Giovanni Santin; Marco Vuolo; Cian Crowley; Asier Abreu; Ralf Kholey; Frederic Lemmel; Hans Smit; Jos de Bruijne
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Paper Abstract

ESA’s astrometry mission Gaia was launched in 2013 to establish the most accurate and complete map of the Milky Way by measuring the distance, position, proper motion, and astrophysical characteristics of two billion stars. It contains the largest focal plane ever flown in space comprising 106 CCDs. To downlink to Earth only useful data, an on-board algorithm was designed to discriminate between e.g. stars and cosmics- ionizing tracks left by energetic particles. A cosmic ray event generation simulator was developed to train and optimize this on-board source detection algorithm. We can now validate this model against Gaia data.

Paper Details

Date Published: 16 July 2018
PDF: 9 pages
Proc. SPIE 10709, High Energy, Optical, and Infrared Detectors for Astronomy VIII, 1070919 (16 July 2018); doi: 10.1117/12.2314090
Show Author Affiliations
Lionel Garcia, European Space Research and Technology Ctr. (Netherlands)
Thibaut Prod'homme, European Space Research and Technology Ctr. (Netherlands)
David Lucsanyi, European Space Research and Technology Ctr. (Netherlands)
Alex Short, European Space Research and Technology Ctr. (Netherlands)
Giovanni Santin, European Space Research and Technology Ctr. (Netherlands)
Marco Vuolo, European Space Research and Technology Ctr. (Netherlands)
Cian Crowley, European Space Astronomy Ctr. (Spain)
Asier Abreu, European Space Astronomy Ctr. (Spain)
Ralf Kholey, European Space Astronomy Ctr. (Spain)
Frederic Lemmel, European Space Research and Technology Ctr. (Netherlands)
Hans Smit, European Space Research and Technology Ctr. (Netherlands)
Jos de Bruijne, European Space Research and Technology Ctr. (Netherlands)


Published in SPIE Proceedings Vol. 10709:
High Energy, Optical, and Infrared Detectors for Astronomy VIII
Andrew D. Holland; James Beletic, Editor(s)

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